Semiconductor Test Software for Components & Discretes by Tektronix

Discover more models. ACS Basic Edition, optimized for parametric testing of component and discrete semiconductor devices, boosts productivity for technicians and engineers in R&D. Its adaptable architecture caters to diverse, evolving semiconductor device testing needs. It supports Keithley's source and measure instruments, including Series 2600B, Series 2400, and touchscreen SourceMeter SMU instruments, along with 2651A, 2657A, and 4200A-SCS SMUs and CVUs. This robust, cost-effective solution offers Keithley's extensive parametric libraries, enabling swift test setup and execution, data gathering, and analysis. Users can customize tests using the embedded script editor. Key features include support for packaged devices, rich test libraries, built-in data analysis tools, instrument compatibility, simplified configuration, and Windows 11/10 compatibility. The software's data analysis tools facilitate quick parametric data analysis, custom calculations, and data saving in graphical and tabular formats. ACS Basic Edition offers three operation modes: Single Test Mode, Multi Test Mode, and Trace Mode, supporting single/multiple tests and interactive device testing. Key applications include materials and device development, quality assurance, and device inspection. For wafer level testing, consider ACS Integrated Test Systems or ACS Wafer Level Reliability Systems.

• Engineered for Packaged Semiconductors: MOSFETs, BJTs, IGBTs, Diodes, Resistors, etc
• Effortless Testing with Extensive Libraries
• Speedy Parametric Data Analysis
• Compatibility with Keithley's SMU Instruments
• Streamlined Hardware Configuration
• Windows 11 & 10 Compatibility
• Single Device, Single Test Operations
• Multiple Tests on a Single Device
• Interactive Device Characteristic Mapping